I-LCP-27 yoMlinganiso woBunzulu beDiffraction
Iimvavanyo
1. Uvavanyo lwe-slit enye, i-slit eninzi, i-porous kunye ne-multi-rectangle diffraction, umthetho we-diffraction intensity utshintsho kunye neemeko zovavanyo.
2.Ikhomputha isetyenziselwa ukurekhoda ubungakanani obuhambelanayo kunye nokusabalalisa ubuninzi be-slit enye, kunye nobubanzi be-single slit diffraction isetyenziselwa ukubala ububanzi be-slit enye.
3.Ukuqwalasela ubuninzi bokusabalalisa kwe-diffraction ye-slit ezininzi, imingxuma yoxande kunye nemingxuma ejikelezayo
4.Ukuqwalasela i-Fraunhofer diffraction ye-slit enye
5.Ukumisela ukuhanjiswa kokukhanya kokukhanya
Iinkcukacha
Into | Iinkcukacha |
Yena-Ne Laser | >1.5 mW @ 632.8 nm |
I-Single-Slit | I-0 ~ 2 mm (i-adjustable) ngokuchaneka kwe-0.01 mm |
Uluhlu lomlinganiselo womfanekiso | 0.03 mm ububanzi bokuqhekeza, 0.06 mm isithuba sokuqhekeza |
IProjekthi yeReferensi yeGrating | 0.03 mm ububanzi bokuqhekeza, 0.06 mm isithuba sokuqhekeza |
Inkqubo yeCCD | 0.03 mm ububanzi bokuqhekeza, 0.06 mm isithuba sokuqhekeza |
Ilensi enkulu | I-Silicon photocell |
AC Power Voltage | 200 mm |
Ukuchaneka koMlinganiselo | ± 0.01 mm |
Bhala umyalezo wakho apha kwaye uwuthumele kuthi